System Overview

The Bruker Dimension Icon AFM incorporates the latest evolution of Bruker’s industry-leading nanoscale imaging and characterization technologies on a large sample tip-scanning AFM platform. The Icon’s temperature-compensating position sensors render noise levels in the sub-angstroms range for the Z-axis, and angstroms in X-Y.

Technical Specifications

• ScanAsyst® Imaging – ScanAsyst is a PeakForce Tapping based image optimization technique that enables every user to create the highest resolution AFM images using single-touch scanning.
• Conventional Tapping Mode – for topology/roughness/step-height measurements
• Magnetic Force Microscopy (MFM) – can be used to image both naturally occurring and deliberately written domain structures in magnetic materials.
• Electric Force Microscopy (EFM) – is used for electrical failure analysis, detecting trapped charges, mapping electric polarization, and performing electrical read/write, among other applications.
• Kelvin Probe Force Microscopy (KPFM) – is widely used for analysing the surface potential of the structures.
• Conductive AFM (CAFM) – used to measure and map current of the sample in the 2pA to 1µA range while simultaneously collecting topographic information.

Location: E6-05-08A, Characterization Room

Contact: e6nanofab@nus.edu.sg