Scroll Top

ATOMIC FORCE MICROSCOPY (AFM)

System Overview

The Park NX20 AFM features the world’s only True Non-Contact™ mode, allowing users to take both repeated measurements without damaging sample surface while preserving tip sharpness. Reputed as the world’s most accurate large sample AFM, The Park NX20 is a leading nano metrology tool for failure analysis and large sample research.

Technical Specifications

  • Large sample measurement of up to 300 mm.
  • Park SmartScan™ – powerful operating software automates processes which drastically improve efficiency and guides user through every step of the imaging process.

Incorporated Scanning Modes

  • True Non-Contact™ mode
  • Dynamic contact mode
  • Contact mode
  • Magnetic Force Microscopy (MFM)
  • Phase Imaging
  • Lateral Force Microscopy (LFM)
  • Force-Distance (F/D) Spectroscopy
  • Force volume Imaging
  • Electricstatic Force Microscopy (EFM)
  • Piezoresponse Force Microscopy (PFM)
  • Scanning Kelvin Probe Microscopy (SKPM)
  • Force Modulation Microscopy (FMM)
  • Nanoindentation
  • Nanolithography
  • Variable Enhanced Conductive AFM (VECA)
  • Scanning Capacitance Microscopy (SCM)

AFM, MFM, CAFM, SCM

Location: E6-01-02, Class 100 Cleanroom

Contact: e6nanofab@nus.edu.sg